Public Documentation

angle_resolved(λs, θs, layers)

Calculate the transmission and reflection at different angles of incidence and wavelengths for a stack of layers.

Arguments

• λs: Vector of wavelengths.
• θs: Vector of angles of incidence in radians.
• layers: Vector of Layer objects representing the stack.

calculate_tr(λ, layers, θ, μ)

Calculate the transmittance and reflectance spectrum of the structure at a single incidence angle θ. Accurate transmittance must be calculated via the Poynting vector. Reflectance is calculated directly from the transfer matrix elements.

calculate_tr(Γ)

Calculate reflectance and transmittance for the total stack. This takes the matrix Γ* in Passler, et al., but for brevity we call it Γ in this function.

The original formalism is from: Yeh, 1979, https://doi.org/10.1364/JOSA.69.000742

but the ordering of reflection/transmission coefficients is modified in Passler, et al. 2017 https://doi.org/10.1364/JOSAB.34.002128

calculate_tr(S::Poynting)

Calculate transmittance from the Poynting vector struct, which contains incident and transmitted energy for both p-polarized and s-polarized waves.

electric_field(λ, layers, θ; dz)

Calculate the electric field profile for the entire structure as a function of z for a given incidence angle θ.

tune_thickness(λs, ts, layers, t_index, θ=0.0)

Tune the thickness of a specific layer in a stack and calculate the transmission and reflection.

Arguments

• λs: Vector of wavelengths.
• ts: Vector of thicknesses.
• layers: Vector of Layer objects representing the stack.
• t_index: Index of the layer in the stack to tune the thickness of.
• θ: Angle of incidence in radians. Default is 0.0 (normal incidence).

Layer(material, thickness)

Construct a single layer with keywords:

• material: refractive material containing dispersion and extinction data (if available)
• thickness: thickness of the layer

dielectric_constant(n_re::Real, n_im::Real)

Return the complex dielectric function from the real and imaginary parts of the index of refraction.

The complex index of refraction, given by

    n' = n_re + i * n_im

(in terms of nre and nim), can be used to obtain the frequency-dependent complex dielectric function

    ε_r(ω) = ε' + iε''

via the relation

    (n_re + i * n_im)^2 = ε' + iε''.

find_bounds(layers)

Find the unitful z coordinate for all layer-layer interfaces in the structure, with the first interface starting at z = 0. (negative z corresponds to positions inside the first layer.)

refractive_index()

Return a function that takes a wavelength and gives the real and imaginary parts of the refractive index

dielectric_tensor(ε1, ε2, ε3)

Return the diagonal complex dielectric tensor

\[\varepsilon = \begin{pmatrix} \varepsilon_1 & 0 & 0 \\0 & \varepsilon_2 & 0 \\0 & 0 & \varepsilon_3 \end{pmatrix}\]

dbr_reflectivity(no, ns, n1, n2, N)

Approximate the reflectivity of a DBR structure with originating medium with refractive index no, substrate with index ns, and alternating materials with indices n1 and n2 and number of repetitions N. The repeated pair of materials are assumed to have quarter-wave thickness $nd = \lambda / 4$, where $n$ is the refractive index, $d$ is the layer thickness, and $\lambda$ is the wavelength of the light.

Distributed Bragg reflector

fresnel(θ, n1, n2)

Calculate the reflectance for s-polarized and p-polarized light given the incidence angle θ and indices of refraction of two media n1 and n2 at a plane interface.

Fresnel equations

stopband(n1, n2)

Calculate the frequency bandwidth Δf of the photonic stopband for a distributed bragg reflector (DBR) with two alternating materials of refractive indices n1 and n2.

\[ \frac{\Delta f_0}{f_0} = \frac{4}{\pi} \arcsin \left( \frac{n_2 - n_1}{n_2 + n_1} \right)\]

Distributed Bragg reflector